Generalized spectral method for near-field optical microscopy
نویسندگان
چکیده
B.-Y. Jiang, L. M. Zhang, A. H. Castro Neto, D. N. Basov, and M. M. Fogler Department of Physics, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093, USA Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, Massachusetts 02215, USA Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, Singapore, Singapore 117542
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملScanning near-field optical microscopy with white-light illumination: nanoscale imaging and spectroscopy of resonant systems
We present the realisation of near-field spectroscopic measurements with fibre-tip-based scanning near-field microscopy. It allows simultaneous acquisition of near-field optical images in a broad spectral range (400 nm to 1000 nm), thus recovering local spectroscopic information. The technique is essential for understanding the resonant interaction of light with nanostructured objects as the fa...
متن کاملClosed-form representations of field components of fluorescent emitters in layered media.
Dipole radiation in and near planar stratified dielectric media is studied theoretically within the context of fluorescence microscopy, as fluorescent emitters are generally modeled by electric dipoles. Although the main emphasis of this study is placed on the closed-form representations of the field components of fluorescent emitters in layered environments in near- and far-field regions, the ...
متن کاملEffects of Far- and Near-Field Multiple Earthquakes on the RC SDOF Fragility Curves Using Different First Shock Scaling Methods
Typically, to study the effects of consecutive earthquakes, it is necessary to consider definite intensity levels of the first shock. Methods commonly used to define intensity involve scaling the first shock to a specified maximum interstorey drift. In this study the structure’s predefined elastic spectral acceleration caused by the first shock is also considered for scaling. This study aims to...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2016